Analysis of 1/f noise in CMOS APS

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3965, Issue , 2000, Pages 168-176

  Tian, Hui ^a   El Gamal, Abbas ^a  

^a STANFORD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; ELECTRIC NETWORK ANALYSIS; FREQUENCY DOMAIN ANALYSIS; MOSFET DEVICES; SPURIOUS SIGNAL NOISE; TIME DOMAIN ANALYSIS;

ACTIVE PIXEL SENSORS (APS);

IMAGE SENSORS;

EID: 0033707839     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (14)