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Volumn 5193, Issue , 2004, Pages 98-104

Smoothing of diamond-turned substrates for extreme ultraviolet lithography illuminators

Author keywords

Diamond turned optics; Extreme ultraviolet lithography; Mo Si multilayers; Polyimide; Smoothing

Indexed keywords

DIAMONDS; ILLUMINATION METERS; LIGHT REFLECTION; MATHEMATICAL MODELS; POLYIMIDES; STRENGTH OF MATERIALS; SURFACE ROUGHNESS; ULTRAVIOLET RADIATION;

EID: 1942518337     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.509220     Document Type: Conference Paper
Times cited : (5)

References (12)
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    • Tichenor, D.A.1
  • 4
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    • (1991) Proc. SPIE , vol.1546 , pp. 63-69
    • Ulmer, M.P.1    Haidle, R.2    Altkorn, R.3    Georgopoulos, P.4    Rodricks, B.5    Takacs, P.Z.6
  • 5
    • 0022866441 scopus 로고
    • Surface heating in a lacquer-coated mirror irradiated with undulator light
    • International Conference on Insertion Devices for Synchrotron Sources
    • R. Tatchyn, P. L. Csonka, E. Källne, A. Toor, C. Gillespie, I. Lindau and A. Fuller, "Surface heating in a lacquer-coated mirror irradiated with undulator light," in International Conference on Insertion Devices for Synchrotron Sources, Proc. SPIE 582, 291-296 (1985).
    • (1985) Proc. SPIE , vol.582 , pp. 291-296
    • Tatchyn, R.1    Csonka, P.L.2    Källne, E.3    Toor, A.4    Gillespie, C.5    Lindau, I.6    Fuller, A.7
  • 7
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    • Multilayer x-ray mirrors: Interfacial roughness, scattering and image quality
    • E. Spiller, D. G. Stearns, and M. Krumrey, "Multilayer x-ray mirrors: interfacial roughness, scattering and image quality," J. Appl. Phys. 74, 107-118 (1993).
    • (1993) J. Appl. Phys. , vol.74 , pp. 107-118
    • Spiller, E.1    Stearns, D.G.2    Krumrey, M.3
  • 9
    • 0034768492 scopus 로고    scopus 로고
    • Recent developments in EUV reflectometry at the Advanced Light Source
    • Emerging Lithographic Technologies V, E. A. Dobisz ed.
    • E. M. Gullikson, S. Mrowka, and B. B. Kaufmann, "Recent developments in EUV reflectometry at the Advanced Light Source," in Emerging Lithographic Technologies V, E. A. Dobisz ed., Proc. SPIE 4343, 363-373 (2001).
    • (2001) Proc. SPIE , vol.4343 , pp. 363-373
    • Gullikson, E.M.1    Mrowka, S.2    Kaufmann, B.B.3
  • 10
    • 0141794543 scopus 로고    scopus 로고
    • System and Process Learning in a Full-Field, High-Power EUVL Alpha Tool
    • Emerging Lithographic Technologies VII, R. L. Engelstad, ed.
    • W. P. Ballard et al, "System and Process Learning in a Full-Field, High-Power EUVL Alpha Tool", in Emerging Lithographic Technologies VII, R. L. Engelstad, ed., Proc. SPIE 5037, 47-57 (2003).
    • (2003) Proc. SPIE , vol.5037 , pp. 47-57
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  • 11
    • 0344440777 scopus 로고    scopus 로고
    • System integration and performance of the EUV engineering test stand
    • Emerging Lithographic Technologies V, E. A. Dobisz ed.
    • D. A Tichenor et al, "System integration and performance of the EUV engineering test stand," in Emerging Lithographic Technologies V, E. A. Dobisz ed., Proc. SPIE 4343, 19-37 (2001).
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  • 12
    • 1942532659 scopus 로고    scopus 로고
    • A detailed discussion of the complex processes taking place hi the EUVL source environment and causing degradation of illuminator optics is beyond the scope of the present manuscript
    • A detailed discussion of the complex processes taking place hi the EUVL source environment and causing degradation of illuminator optics is beyond the scope of the present manuscript.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.