Polarity determination of ZnO thin films by electron holography

Applied Physics Letters

Volumn 84, Issue 12, 2004, Pages 2067-2069

  Xu, Q Y ^a   Wang, Y ^a   Wang, Y G ^a   Du, X L ^a   Xue, Q K ^a   Zhang, Z ^b  

^a INSTITUTE OF PHYSICS   (China)

^b BEIJING UNIVERSITY OF TECHNOLOGY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLOGRAPHY; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON HOLOGRAPHY; FABRICATION; FUNCTIONS; HIGH RESOLUTION ELECTRON MICROSCOPY; METALLIC FILMS; MOLECULAR BEAM EPITAXY; POLARIZATION; SEMICONDUCTING GALLIUM ARSENIDE; ZINC OXIDE;

DIMPLING; POLARITY;

THIN FILMS;

EID: 1942476936     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1669060     Document Type: Article

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