Effect of la and y on crystallization temperatures of hafnia and zirconia

Journal of Materials Research

Volumn 19, Issue 3, 2004, Pages 693-696

  Ushakov, Sergey V ^a   Brown, Crystalyn E ^a   Navrotsky, Alexandra ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

Amorphous; Dielectric properties; Differential thermal analysis (DTA)

Indexed keywords

AMORPHOUS MATERIALS; DIELECTRIC PROPERTIES; DIFFERENTIAL THERMAL ANALYSIS; GATE DIELECTRICS; HAFNIUM OXIDES; X RAY DIFFRACTION; COMPOSITION; CRYSTALLIZATION; DIELECTRIC MATERIALS; DOPING (ADDITIVES); HAFNIUM COMPOUNDS; HIGH TEMPERATURE PROPERTIES; LANTHANUM; TEMPERATURE; THERMOANALYSIS; X RAY DIFFRACTION ANALYSIS; YTTRIUM; ZIRCONIA;

CRYSTALLIZATION TEMPERATURE; DIFFERENTIAL THERMAL ANALYSES (DTA); HIGH TEMPERATURE X-RAY DIFFRACTION; NANO-PHASE POWDER; Y-DOPING;

ZIRCONIA; AMORPHOUS MATERIALS;

GATE DIELECTRICS; HAFNIA; HIGH TEMPERATURE X-RAY DIFFRACTION; NANOPHASE POWDERS;

EID: 1942423547     PISSN: 08842914     EISSN: 20445326     Source Type: Journal    
DOI: 10.1557/jmr.2004.19.3.693     Document Type: Article

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