A combinatorial approach to TCO synthesis and characterization

Materials Research Society Symposium - Proceedings

Volumn 666, Issue , 2001, Pages F161-F1612

  Perkins, John ^a   Readey, Dennis ^a   Alleman, Jeff ^a   Del Cueto, Joe ^a   Li, Xiaonan ^a   Coutts, Tim ^a   Stauber, Renaud ^a   Duncan, Chris ^a   Young, David ^a   Parilla, Phil ^a   Keyes, Brian ^a   Gedvilas, Lynn ^a   Balzar, Davor ^b   Wang, Qi ^a   Ginley, David ^a  

^a NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; CHEMICAL VAPOR DEPOSITION; ELECTRIC CONDUCTIVITY; MATERIALS SCIENCE; OXIDES; RAMAN SCATTERING; SPUTTERING; SYNTHESIS (CHEMICAL); X RAY DIFFRACTION ANALYSIS;

TRANSPARENT CONDUCTING OXIDES (TCO);

CONDUCTIVE MATERIALS;

EID: 19244382278     PISSN: 02729172     EISSN: None     Source Type: Journal    
DOI: 10.1557/proc-666-f1.6     Document Type: Article

References (26)