Eu- and Yb-induced reconstructions on a vicinal Si(1 0 0) surface

Surface Science

Volumn 584, Issue 1, 2005, Pages 8-16

  Perala R E ^a   Kuzmin, M ^a   Laukkanen, P ^a   Vaara, R L ^a   Vayrynen I J ^a  

^a UNIVERSITY OF TURKU   (Finland)

Author keywords

Europium; Silicon; Surface structure, morphology, roughness, and topography; Vicinal single crystal surfaces; Ytterbium

Indexed keywords

CRYSTAL STRUCTURE; ELECTRON DIFFRACTION; EUROPIUM; MONOLAYERS; MORPHOLOGY; SCANNING TUNNELING MICROSCOPY; SILICON; SURFACE ROUGHNESS; SURFACE STRUCTURE; SURFACE TOPOGRAPHY; YTTERBIUM;

ENERGY ELECTRON DIFFRACTION; SILICIDE NANOWIRES; SUBMONOLAYERS; VICINAL SINGLE CRYSTAL SURFACE;

RARE EARTH ELEMENTS;

EID: 19044394696     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2005.02.060     Document Type: Conference Paper

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