SCOPUS 정보 검색 플랫폼

Volumn 34, Issue 3, 2005, Pages 203-206

La/B4C small period multilayer interferential mirror for the analysis of boron

(9) Andre J M a Jonnard, P a Michaelsen, C b Wiesmann, J b Bridou, F c Ravet, M F c Jerome A c Delmotte, F c Filatova, E O d

a Université Pierre et Marie Curie (France)

b Incoatec GmbH ^* (Germany)

c UNIV PARIS SUD (France)

d ST PETERSBURG STATE UNIVERSITY (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL DETECTION; MIRRORS; MULTILAYERS; SPECTROMETRY; SYNCHROTRON RADIATION;

BRAGG ANGLES; DETECTION LIMITS; DIODE SPUTTERING; ENERGY; GRAZING INCIDENCE X-RAY REFLECTOMETRY; INTERFERENTIAL MIRROR; LEAD STEARATE; PERFORMANCE; SPECTROMETRIC MEASUREMENTS; WAVELENGTH-DISPERSIVE X-RAY SPECTROMETRIES;

BORON;

EID: 18844452205 PISSN: 00498246 EISSN: None Source Type: Journal
DOI: 10.1002/xrs.793 Document Type: Article

Times cited : (34)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.