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X-Ray Spectrometry

Volumn 28, Issue 3, 1999, Pages 163-167

Use of Layered Synthetic Microstructures for the Quantitative X-Ray Analysis of Light Elements

(4) Hombourger, C a Jonnard, P a Andre J M a Chauvineau, J P b

a SORBONNE UNIVERSITÉ (France)

b INSTITUT D'OPTIQUE GRADUATE SCHOOL (France)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL ELEMENTS; X RAY ANALYSIS;

ANALYSIS OF LIGHT ELEMENTS; ANOMALOUS DIFFUSION; DIFFUSION PHENOMENA; HIGH INTENSITY; KΑ; LIGHT ELEMENTS; LONG WAVELENGTH; MEASUREMENTS OF; PEAK-TO-BACKGROUND RATIOS;

MICROSTRUCTURE;

EID: 0033438744 PISSN: 00498246 EISSN: None Source Type: Journal
DOI: 10.1002/(SICI)1097-4539(199905/06)28:3<163::AID-XRS331>3.0.CO;2-Z Document Type: Article

Times cited : (20)

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