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Physica B: Condensed Matter

Volumn 308-310, Issue , 2001, Pages 554-557

High resolution minority carrier transient spectroscopy of defects in Si and Si/SiGe quantum wells

(2) Evans Freeman, J H a Gad, M A a

a UNIVERSITY OF MANCHESTER (United Kingdom)

Author keywords

Laplace MCTS; Quantum wells; SiGe

Indexed keywords

CRYSTAL DEFECTS; ELECTRIC FIELD EFFECTS; ELECTRON EMISSION; ELECTRON TUNNELING; HOLE TRAPS; MOLECULAR BEAM EPITAXY; SEMICONDUCTING SILICON COMPOUNDS;

LAPLACE MINORITY CARRIER TRANSIENT SPECTROSCOPY (LMCTS);

SEMICONDUCTOR QUANTUM WELLS;

EID: 18744437764 PISSN: 09214526 EISSN: None Source Type: Journal
DOI: 10.1016/S0921-4526(01)00825-0 Document Type: Article

Times cited : (6)

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