Structural and optical properties of rare-earth-doped Y 2O 3 waveguides grown by pulsed-laser deposition

Journal of Applied Physics

Volumn 92, Issue 9, 2002, Pages 4885-4890

  Pons Y Moll, Olivier ^a   Perriere, Jacques ^a   Millon, Eric ^a   Defourneau, Reine Marie ^a   Defourneau, Daniel ^a   Vincent, Brice ^b   Essahlaoui, Abdel ^b   Boudrioua, Azzedine ^b   Seiler, Wilfrid ^c  

^a SORBONNE UNIVERSITÉ   (France)

^b SUPELEC   (France)

^c ARTS ET MÉTIERS PARISTECH   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CUBIC PHASE; GROWTH CONDITIONS; HIGH REFRACTIVE INDEX; M-LINES SPECTROSCOPY; MORPHOLOGICAL FEATURES; NEAR INFRARED REGION; OPTIMAL CONDITIONS; OXIDE THIN FILMS; OXYGEN PRESSURE; STRUCTURAL AND OPTICAL PROPERTIES; WAVEGUIDING PROPERTIES;

ATOMIC FORCE MICROSCOPY; ERBIUM; EUROPIUM; PULSED LASER DEPOSITION; REFRACTIVE INDEX; SURFACE ROUGHNESS; X RAY DIFFRACTION;

WAVEGUIDES;

EID: 18744400273     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1508422     Document Type: Article

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