Shadow-evaporated nanometre-sized gaps and their use in electrical studies of nanocrystals

Nanotechnology

Volumn 16, Issue 6, 2005, Pages 631-634

  Sun, L F ^a   Chin, S N ^a   Marx, E ^a   Curtis, K S ^a   Greenham, N C ^a   Ford, C J B ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON NANOTUBES; ELECTRIC CHARGE; ELECTRIC CURRENTS; ELECTRIC POTENTIAL; ELECTRODES; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTOR QUANTUM DOTS; SILICA;

COULOMB CHARGING; CURRENT-VOLTAGE CHARACTERISTICS; SHADOW-EVAPORATION TECHNIQUE; ULTRASONIC BATHS;

NANOSTRUCTURED MATERIALS;

EID: 18744399270     PISSN: 09574484     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-4484/16/6/002     Document Type: Article

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