Methods for atom probe analysis of microgradients in functionally graded cemented carbides

Micron

Volumn 33, Issue 7-8, 2002, Pages 639-646

  Frykholm, Robert ^a   Jansson, B ^b   Andren H O ^a  

^a CHALMERS UNIVERSITY OF TECHNOLOGY   (Sweden)

^b AB Sandvik Coromant   (Sweden)

Author keywords

Focused ion beam milling; Gradient sintering; Specimen preparation

Indexed keywords

ARTICLE;

EID: 18744398495     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0968-4328(02)00025-2     Document Type: Article

References (19)

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