A comparison between quantitative EELS and APFIM microanalysis of carbonitride grains in cermets

Ultramicroscopy

Volumn 79, Issue 1-4, 1999, Pages 273-281

  Zackrisson, J ^a   Grogger, W ^b   Hofer, F ^b   Andren H O ^a  

^a CHALMERS UNIVERSITY OF TECHNOLOGY   (Sweden)

^b GRAZ UNIVERSITY OF TECHNOLOGY   (Austria)

Author keywords

Cermets; Hardmetals; Light elements; TEM; Ti(C, N)

Indexed keywords

CARBON; CEMENT; TITANIUM;

ARTICLE; COMPARATIVE STUDY; CONTROLLED STUDY; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON MICROSCOPY; FIELD EMISSION; MICROANALYSIS; NONHUMAN; QUANTITATIVE ASSAY; TRANSMISSION ELECTRON MICROSCOPY; X RAY ANALYSIS;

CERMETS; CRYSTAL MICROSTRUCTURE; ELECTRON ENERGY LOSS SPECTROSCOPY; MICROANALYSIS; TITANIUM CARBIDE; TITANIUM NITRIDE; TRANSMISSION ELECTRON MICROSCOPY;

ATOM PROBE FIELD ION MICROSCOPY (APFIM);

ION MICROSCOPES;

ANGUILLIFORMES;

EID: 0032586221     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(99)00054-6     Document Type: Article

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