A method for the characterization of strain fields in buried quantum dots using x-ray standing waves

Journal of Physics D: Applied Physics

Volumn 38, Issue 10 A, 2005, Pages

  Novak J ^a,b   Holy V ^b   Stangl, J ^a   Bauer, G ^a   Wintersberger, E ^a   Kiravittaya, S ^c   Schmidt, O G ^c  

^a JOHANNES KEPLER UNIVERSITY LINZ   (Austria)

^b MASARYK UNIVERSITY   (Czech Republic)

^c MAX PLANCK INSTITUT FÜR FESTKÖRPERFORSCHUNG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; CRYSTAL GROWTH; DATA REDUCTION; LATTICE CONSTANTS; MATHEMATICAL TRANSFORMATIONS; MULTILAYERS; X RAY DIFFRACTION;

GRAZING INCIDENCE DIFFRACTION (GID); ISO-STRAIN METHOD (ISM); MOMENTUM TRANSFERS; STRAIN FIELDS;

SEMICONDUCTOR QUANTUM DOTS;

EID: 18744373615     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/38/10A/026     Document Type: Article

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