Epitaxial growth and magnetic properties of Cr-doped AlN thin films

Journal of Physics Condensed Matter

Volumn 17, Issue 21, 2005, Pages 3137-3142

  Zhang, Jun ^a   Liou, S H ^a   Sellmyer, D J ^a  

^a UNIVERSITY OF NEBRASKA LINCOLN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM NITRIDE; EPITAXIAL GROWTH; FERROMAGNETIC MATERIALS; MAGNETIC PROPERTIES; MAGNETRON SPUTTERING; SEMICONDUCTOR DOPING; X RAY DIFFRACTION ANALYSIS;

DOPED OXIDES; SAPPHIRE SUBSTRATES; TOTAL MAGNETIZATION; WURTZITE-TYPE HEXAGONAL STRUCTURE;

MAGNETIC THIN FILMS;

EID: 18744367514     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/17/21/009     Document Type: Article

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