A novel portable, high-luminosity monochromatically tunable x-ray microscope

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4504, Issue , 2001, Pages 240-252

  Flora, F ^a   Bollanti, S ^a   Lai, A ^a   Di Lazzaro, P ^a   Letardi, T ^a   Grilli, A ^b   Palladino, L ^c   Tomassetti, G ^c   Reale, A ^c   Reale, L ^c   Scafati, A ^c   Bacchetta, L ^d   Alainelli, L ^e   Sanchez Del Rio, M ^e   Pikuz, T A ^f   Faenov, A Y ^f  

^a ENEA   (Italy)

^b INFN LABORATORI NAZIONALI DI FRASCATI   (Italy)

^c LABORATORI NAZIONALI DEL GRAN SASSO   (Italy)

^d ENEA C R CASACCIA   (Italy)

^e EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^f Multicharged Ions Spectra Data Center of VNIIFTRI   (Russian Federation)

Author keywords

Laser plasma diagnostics; X ray backlighting; X ray optic

Indexed keywords

LASER PRODUCED PLASMAS; MONOCHROMATORS; RAY TRACING; SYNCHROTRON RADIATION; X RAY TUBES; X RAYS;

X-RAY BACKLIGHTING;

X RAY OPTICS;

EID: 18644383743     PISSN: 0277786X     EISSN: None     Source Type: Journal    
DOI: 10.1117/12.448472     Document Type: Article

References (22)

1. "X-ray microscopy and spectromicroscopy", J. Thieme, G. Schmahl, D. Rudolph and E. Umbach (editors) Springer, Berlin (1998).
2. K. Yada and S. Takahashi, in "X-ray microscopy II", D. Sayre et al. (editors), 323, Springer Verlag (1988).
3. J. Kirz, C. Jacobsen, and M. Howells, Q. Rev. Biophys. 28 1 (1995).
4. P. Dhez, P. Chevallier, T.B. Lucatorto and C. Tarrio, Rev. Sci. Instrum. 70 1907 (1999).
5. V.E. Cosslet, A. Engstrom and H.H. Pattee "X-ray microscopy and microradiography" Academic, New York, (1957).
6. V.E. Coslett and W.C. Nixon, "X-ray microscopy" Cambridge Univ. Press, Cambridge (1960).
7. G. Schmahl, D. Rudolph, P. Guttman, G. Scheider, J. Thjeime and B. Niemann, Rev. Sci. Instrum. 66, 1282 (1995).
8. S.A. Pikuz, T.A. Shelkovenko, V.M. Romanova et al. Rev. Sci. Instrum. 68, 740 (1997).
9. Y. Aglitskiy, T. Lehecka, S. Obenschain, C. Pawley, C.M. Brown and J. Seely, Rev. Sci. Instrum. 70 530 (1999).
10. M. Sanchez del Rio, A.Ya. Faenov, V.M. Dyakin et al.Physica Scripta 55 735-(1997).
11. J.A. Koch, O.L. Landen, T.W. barbee et al. Appied Optics 37, 1784 (1998).
12. Y. Aglitskiy et al. Appl. Opt. 37, 5253 (1998).
13. J. Workman, S. Evans, G.A. Kyrala. Rev. Sci. Indrum. 72, 674 (2001).
14. E. Förster, K. Gäbel and I. Uchmann, in "X-ray microscopy III" A. Michette et al. (editors), 202-205, Springer (1992).
15. P. Kirkpatrick and A.V. Baez, J. Opt. Soc. Am., 38 766 (1948).
16. M. Sanchez del Rio, M. Fraenkel, A. Ziegler, A.Ya. Faenov and T.A. Pikuz, Rev. Sci. Instrum. 70, 1614 (1999).
17. C. Welnak, G.-J. Chen and F. Cerrina, Nucl. Instrum. Meth. 347, 338 (1994).
18. M. Fraenkel, A. Zigler, A.Ya. Faenov, T.A. Pikuz, Physica Scripta 59 246 (1999).
19. T.A. Pikuz, A.Ya. Faenov, M. Fraenkel et al. SPIE Proceedings 3767, 67 (1999).
20. T.A. Pikuz, A.Ya. Faenov, M. Fraenkel et al. Laser and Particle Beams (accepted).
21. S. Bollanti, R. Cotton, P. Di Lazzaro et al., Il Nuovo Cimento 18D, 1241 (1996).
22. S. Bollanti, P. Albertano, M. Belli et al. Il Nuovo Cimento 20D, 1685(1998).