High-resolution monochromatic x-ray imaging system based on spherically bent crystals

Applied Optics

Volumn 37, Issue 22, 1998, Pages 5253-5261

  Aglitskiy, Yefim ^a   Lehecka, Thomas ^a   Obenschain, Stephen ^b   Bodner, Stephen ^b   Pawley, Carl ^b   Gerber, Kent ^b   Sethian, John ^b   Brown, Charles M ^b   Seely, John ^b   Feldman, Uri ^b   Holland, Glenn ^c  

^a SCIENCE APPLICATIONS INTERNATIONAL CORPORATION   (United States)

^b NAVAL RESEARCH LABORATORY   (United States)

^c SFA INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001253342     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.37.005253     Document Type: Article

References (38)

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