Electron transport uniformity characterization of CdZnTe using alpha particles

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3446, Issue , 1998, Pages 179-190

  Amman, M ^a   Lee, J S ^a   Luke, P N ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

CdZnTe; Compound semiconductor; Coplanar grid; Electron transport characterization; Gamma ray detector

Indexed keywords

ALPHA PARTICLES; ELECTRODES; ELECTRON TRANSPORT PROPERTIES; GAMMA RAYS; SEMICONDUCTING CADMIUM COMPOUNDS;

CADMIUM ZINC TELLURIDE; GAMMA RAY DETECTORS; GAMMA RAY SPECTROSCOPY;

RADIATION DETECTORS;

EID: 0032404472     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.312890     Document Type: Conference Paper

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