Sb adsorption on Si(1 1 1)-In(4 × 1) surface phase

Applied Surface Science

Volumn 175-176, Issue , 2001, Pages 187-194

  Rao, B V ^a   Gruznev, D ^a   Tambo, T ^a   Tatsuyama, C ^a  

^a UNIVERSITY OF TOYAMA   (Japan)

Author keywords

Auger electron spectroscopy; InSb; Interface formation; Reflection high energy electron diffraction; Sb adsorption; Si(1 1 1) In(4 1) reconstruction

Indexed keywords

ANTIMONY; AUGER ELECTRON SPECTROSCOPY; COALESCENCE; INTERFACES (MATERIALS); REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SILICON; SURFACE STRUCTURE;

INTERFACE FORMATION; SURFACE RECONSTRUCTION;

ADSORPTION;

EID: 18544397081     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(01)00060-5     Document Type: Article

References (15)

1. B.V. Rao, et al., Jpn. J. Appl. Phys. 39 (2000) 3935.
2. Kanisawa K., Yamaguchi H., Hirayama Y. Appl. Phys. Lett. 76:2000;589.
3. V.G. Lifshits, A.A. Saranin, A.V. Zotov (Eds.), Surface Phases on Silicon, Wiley, Chichester, 1994.
4. Ryzhkov S.V., Lifshits V.G., Azatyan S.G., Zotov A.V., Hayakawa Y., Kumagawa M. Phys. Low-Dim. Struct. 1/2:1996;99.
5. Franklin G.E., Rich D.H., Hong H., Miller T., Chiang T.-C. Phys. Rev. B. 45:1992;3426.
6. B.V. Rao, et al., Jpn. J. Appl. Phys. 37 (1998) L1297.
7. B.V. Rao, et al., J. Appl. Phys. 87 (2000) 724.
8. Kitabatake M., Kawasaki T., Korechika T. Thin solid films. 281/282:1996;17.
9. A.A. Saranin, et al., Phys. Rev. B 60 (1999) 14372.
10. O. Bunk, et al., Phys. Rev. B 59 (1999) 12228.
11. O. Bunk, et al., Phys. Rev. B 60 (1999) 13905.
12. Elswijk H.B., Dijkkamp D., van Loenen E.J. Phys. Rev. B. 44:1991;3802.
13. Park C.Y., Abukawa T., Kinoshita T., Enta Y., Kono S. Jpn. J. Appl. Phys. 27:1988;147.
14. Kinoshita T., Enta Y., Ohta H., Yaegashi Y., Suzuki S., Kono S. Surf. Sci. 204:1988;405.
15. B.V. Rao, et al., submitted for publication.