Trace element diffusion in rhyolitic melts: Comparison between synchrotron radiation X-ray fluorescene microanalysis (μ-SRXRF) and secondary ion mass spectrometry (SIMS)

European Journal of Mineralogy

Volumn 17, Issue 2, 2005, Pages 233-242

  Hahn, Matthias ^a   Behrens, Harald ^a   Tegge Schüring, Astrid ^a   Koepke, Jürgen ^a   Horn, Ingo ^a   Rickers, Karen ^b,c   Falkenberg, Gerald ^b   Wiedenbeck, Michael ^c  

^a LEIBNIZ UNIVERSITY HANNOVER   (Germany)

^b DESY   (Germany)

^c GFZ GERMAN RESEARCH CENTRE FOR GEOSCIENCES   (Germany)

Author keywords

Rhyolite; SIMS; Synchroton radiation X ray fluorescence microanalysis; Trace element diffusion

Indexed keywords

CALCIUM OXIDE; DIFFUSION; EXPLORATORY GEOCHEMISTRY; FLUORESCENCE; INDUCTIVELY COUPLED PLASMA; LASER ABLATION; MICROANALYSIS; NICKEL COMPOUNDS; RARE EARTHS; SECONDARY EMISSION; SECONDARY ION MASS SPECTROMETRY; SILICON COMPOUNDS; SODIUM COMPOUNDS; SYNCHROTRON RADIATION; SYNCHROTRONS; TRANSITION METALS; X RAYS;

ELEMENT DIFFUSION; HIGH FIELD STRENGTH ELEMENTS; MAIN-GROUP ELEMENTS; MICROBEAM TECHNIQUE; RHYOLITE; SYNCHROTRON RADIATION X-RAY FLUORESCENCE; SYNCHROTRON RADIATION X-RAYS; X RAY FLUORESCENCE;

TRACE ELEMENTS;

ANALYTICAL METHOD; COMPARATIVE STUDY; DIFFUSION; MASS SPECTROMETRY; RHYOLITE; SILICATE MELT; TRACE ELEMENT; X-RAY FLUORESCENCE;

EID: 18444381750     PISSN: 09351221     EISSN: None     Source Type: Journal    
DOI: 10.1127/0935-1221/2005/0017-0233     Document Type: Article

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