Improved subthreshold slope method for precise extraction of gate capacitive coupling coefficients in stacked gate and source-side injection flash memory cells

Solid-State Electronics

Volumn 48, Issue 7, 2004, Pages 1189-1195

  Cho, Caleb Yu Sheng ^a   Chen, Ming Jer ^a  

^a NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

Author keywords

Capacitive coupling; Flash memory; Mismatch; MOSFETs; Process variations; Subthreshold

Indexed keywords

CAPACITANCE; ERROR ANALYSIS; FLASH MEMORY; MOSFET DEVICES; THRESHOLD VOLTAGE; ULTRAVIOLET RADIATION;

CAPACITIVE COUPLING; MISMATCH; PROCESS VARIATIONS; PROCESS-VARIATION IMMUNITY METHOD; SUBTHRESHOLD; SUBTHRESHOLD SWING (SS) RATIO METHOD;

GATES (TRANSISTOR);

EID: 1842832726     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sse.2004.01.008     Document Type: Article

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