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Surface and Coatings Technology

Volumn 180-181, Issue , 2004, Pages 227-233

Characterization by electron spin resonance of defects in a-C:H thin films. Correlation between structural evolutions and optical properties

(4) Tomasella, E a Dubois, M a Meunier, C b Thomas, L c

a UNIVERSITÉ CLERMONT AUVERGNE (France)

b FEMTO ST INSTITUTE (France)

c CNRS (France)

Author keywords

A C:H thin films; Disorder; Electron spin resonance; Optical properties; Structure

Indexed keywords

ELECTRIC POTENTIAL; INFRARED SPECTROSCOPY; MIXTURES; PARAMAGNETIC RESONANCE; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; RAMAN SPECTROSCOPY;

BIAS VOLTAGE; GAS MIXTURES;

THIN FILMS;

COATING;

EID: 1842815829 PISSN: 02578972 EISSN: None Source Type: Journal
DOI: 10.1016/j.surfcoat.2003.10.045 Document Type: Article

Times cited : (4)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.