|
Volumn 13, Issue 3, 2004, Pages 451-458
|
Measurement of the relative abundance of sp2 and sp3 hybridised atoms in carbon-based materials by XPS: A critical approach. Part II
|
Author keywords
Carbon hybridisation; Irradiated HOPG; Photoelectron spectroscopy
|
Indexed keywords
ARGON;
AUGER ELECTRON SPECTROSCOPY;
GRAPHITE;
MOLECULAR STRUCTURE;
SPECTRUM ANALYSIS;
X RAY PHOTOELECTRON SPECTROSCOPY;
HIGHLY ORIENTED PYROLYTIC GRAPHITE (HOPG);
POLYCRYSTALLINE GRAPHITE;
DIAMONDS;
CARBON;
|
EID: 1842714355
PISSN: 09259635
EISSN: None
Source Type: Journal
DOI: 10.1016/j.diamond.2003.11.075 Document Type: Article |
Times cited : (19)
|
References (42)
|