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Volumn 13, Issue 3, 2004, Pages 451-458

Measurement of the relative abundance of sp2 and sp3 hybridised atoms in carbon-based materials by XPS: A critical approach. Part II

Author keywords

Carbon hybridisation; Irradiated HOPG; Photoelectron spectroscopy

Indexed keywords

ARGON; AUGER ELECTRON SPECTROSCOPY; GRAPHITE; MOLECULAR STRUCTURE; SPECTRUM ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 1842714355     PISSN: 09259635     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.diamond.2003.11.075     Document Type: Article
Times cited : (19)

References (42)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.