Assessment of nondiamond carbon levels present in chemical vapor deposited diamond by analysis of the plasmon loss features of x-ray photoelectron spectra

Applied Physics Letters

Volumn 68, Issue 4, 1996, Pages 469-471

  Haq, S ^a   Tunnicliffe, D L ^a   Sails, S ^b   Savage, J A ^c  

^a BAE SYSTEMS   (United Kingdom)

^b NORTHUMBRIA UNIVERSITY   (United Kingdom)

^c DRA   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0010020025     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.116416     Document Type: Article

References (5)

1. D. Briggs and M. P. Seah, eds., Practical Surface Analysis, Auger and X-Ray Photoelectron Spectroscopy, 2nd ed. (Wiley, Chichester, England, 1990), Vol. 1.
2. A. Cook, A. Fitzgerald, B. Storey, J. Wilson, P. John, M. Jubber, D. Milne, I. Drummond, J. Savage, and S. Haq, Diam. Relat. Mater. INS 1, 478 (1992).
3. J. Wagner, M. Ramsteiner, Ch. Wild, and P. Koidl, Phys. Rev. B AIP 40, 3 (1989).
4. M. P. Seah and W. E. Dench, Surf. Interface Anal. INS 1, 2 (1979).
5. S. Sails, D. Gardiner, M. Bowden, J. Savage, and S. Haq, Appl. Phys. Lett. AIP 65, 1 (1994).