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Volumn 98, Issue 2-4, 2004, Pages 165-172
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The effect of inelastic scattering on crystal structure refinement from electron diffraction patterns recorded under almost parallel illumination
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Author keywords
61.14. x; Crystal structure refinement; Electron diffraction; Inelastic scattering; Parallel illumination
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Indexed keywords
AMORPHOUS MATERIALS;
CARBON;
ELECTRON BEAMS;
ELECTRON DIFFRACTION;
ELECTRON SCATTERING;
FILTRATION;
PLASMA THEORY;
INELASTIC SCATTERING;
PLASMON-LOSS ELECTRONS;
CRYSTAL STRUCTURE;
CARBON;
ACCURACY;
ARTICLE;
ATOM;
CRYSTAL STRUCTURE;
ELASTICITY;
ELECTRON;
ELECTRON DIFFRACTION;
ELECTRON MICROSCOPY;
ILLUMINATION;
MICROFILTRATION;
RADIATION SCATTERING;
STRUCTURE ANALYSIS;
ULTRAFILTRATION;
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EID: 1842525205
PISSN: 03043991
EISSN: None
Source Type: Journal
DOI: 10.1016/j.ultramic.2003.08.010 Document Type: Article |
Times cited : (7)
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References (16)
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