Reference specimens for x-ray stress analysis: The French experience

Metrologia

Volumn 41, Issue 1, 2004, Pages 33-40

  Francois M ^a   Ferreira, C ^b,c   Botzon, R ^b  

^a UNIVERSITÉ DE TECHNOLOGIE DE TROYES   (France)

^b INSTITUT DE RECHERCHE EN GÉNIE CIVIL ET MÉCANIQUE GEM   (France)

^c CENTRO RICERCHE FIAT   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

METROLOGICAL SYSTEMS; X-RAY STRESS ANALYSIS;

ERROR ANALYSIS; INFORMATION TECHNOLOGY; NEUTRON DIFFRACTION; PROBLEM SOLVING; ROTATION; SHEAR STRENGTH; STRESS ANALYSIS; SYNCHROTRON RADIATION; TENSORS; X RAY DIFFRACTION;

X RAY ANALYSIS;

EID: 1842430785     PISSN: 00261394     EISSN: None     Source Type: Journal    
DOI: 10.1088/0026-1394/41/1/005     Document Type: Article

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