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Volumn 347, Issue , 2000, Pages 12-16
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Towards reference samples for X-ray residual stress analysis
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Author keywords
[No Author keywords available]
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Indexed keywords
FINITE ELEMENT METHOD;
RESIDUAL STRESSES;
X RAY DIFFRACTION ANALYSIS;
ROUND ROBIN TESTS;
STRESS ANALYSIS;
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EID: 17744416519
PISSN: 02555476
EISSN: None
Source Type: Conference Proceeding
DOI: 10.4028/www.scientific.net/msf.347-349.12 Document Type: Article |
Times cited : (1)
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References (8)
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