Round robin test on the determination of residual stress depth distributions by X-ray diffraction

Materials Science Forum

Volumn 404-407, Issue , 2002, Pages 659-664

  Gibmeier, J ^a   Lu, J ^a   Scholtes, B ^a  

^a UNIVERSITY OF KASSEL   (Germany)

Author keywords

ENSPED; Gradient; Round robin test; Shot peening; X ray diffraction

Indexed keywords

COMPUTER SOFTWARE; QUENCHING; RESIDUAL STRESSES; SHOT PEENING; STEEL; STRESS ANALYSIS; SURFACE MEASUREMENT; X RAY DIFFRACTION ANALYSIS;

ROUND ROBIN TESTS;

MATERIALS SCIENCE;

EID: 0036429111     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.404-407.659     Document Type: Conference Paper

References (3)

1. V. Hauk: Structural and Residual Stress Analysis by Nondestructive Methods (Elseviers, The Netherlands, 1997).
2. E. Macherauch, P. Müller: Zeitschrift fuer angewandte Physik, Vol. 13 (1961), p. 305.
3. H.-U. Baron, H. Behnken, B. Eigenmann, J. Gibmeier, Th. Hirsch, W. Pfeiffer, B. Scholtes: Verfahrensbeschreibung: Röntgenographische Ermittlung von Spannungen - (AWT e.V., Germany, 2001).