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Volumn 398-399, Issue , 2001, Pages 591-596

Electron emission enhanced chemical vapor deposition (EEECVD) for the fabrication of diverse silicon-containing films

Author keywords

Electron emission enhanced CVD; Hexamethyldisiloxane; HFCVD; Plasma polymers; Tetramethylsilane; Thin films; Transmission infrared spectroscopy

Indexed keywords

ARGON; CHEMICAL VAPOR DEPOSITION; ELECTRON EMISSION; INFRARED SPECTROSCOPY; MONOMERS; PLASMA POLYMERIZATION; THIN FILMS; VACUUM APPLICATIONS;

EID: 18344402227     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(01)01324-4     Document Type: Article
Times cited : (4)

References (18)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.