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Volumn 398-399, Issue , 2001, Pages 591-596
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Electron emission enhanced chemical vapor deposition (EEECVD) for the fabrication of diverse silicon-containing films
a a a |
Author keywords
Electron emission enhanced CVD; Hexamethyldisiloxane; HFCVD; Plasma polymers; Tetramethylsilane; Thin films; Transmission infrared spectroscopy
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Indexed keywords
ARGON;
CHEMICAL VAPOR DEPOSITION;
ELECTRON EMISSION;
INFRARED SPECTROSCOPY;
MONOMERS;
PLASMA POLYMERIZATION;
THIN FILMS;
VACUUM APPLICATIONS;
ELECTRON IMPACT FRAGMENTATION;
AMORPHOUS FILMS;
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EID: 18344402227
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/S0040-6090(01)01324-4 Document Type: Article |
Times cited : (4)
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References (18)
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