Image quality analysis: A new method of characterizing microstructures

ISIJ International

Volumn 45, Issue 2, 2005, Pages 254-262

  Wu, Jinghui ^a   Wray, Peter J ^a   Garcia, Calixto I ^a   Hua, Mingjian ^a   Deardo, Anthony J ^a  

^a UNIVERSITY OF PITTSBURGH   (United States)

Author keywords

Diffraction pattern; EBSD; Ferrite; Grain boundary; Image quality; Lattice imperfection; Microstructure; Phase identification

Indexed keywords

CHARACTERIZATION; CHEMICAL ANALYSIS; CRYSTAL DEFECTS; CRYSTAL LATTICES; FERRITES; GRAIN BOUNDARIES; IMAGE ANALYSIS; IMAGE QUALITY; POLYCRYSTALLINE MATERIALS; SCANNING ELECTRON MICROSCOPY; STEEL; STRENGTH OF MATERIALS; THERMOMECHANICAL TREATMENT;

DIFFRACTION PATTERNS; EBSD; LATTICE IMPERFECTION; PHASE IDENTIFICATION; POLYCRYSTALLINE AGGREGATES;

MICROSTRUCTURE;

EID: 18344386807     PISSN: 09151559     EISSN: None     Source Type: Journal    
DOI: 10.2355/isijinternational.45.254     Document Type: Article

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