Alternatives to Image Quality (IQ) mapping in EBSD

Microscopy and Microanalysis

Volumn 8, Issue SUPPL. 2, 2002, Pages 692-693

  Tao, Xiaodong ^a   Eades, Alwyn ^a  

^a Lehigh University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0036412107     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/s1431927602106465     Document Type: Conference Paper

References (3)

1. TM Data Collection Manual. TSL Company.
2. We are grateful to TSL for allowing us to use their source code.
3. Support from DOE, under grant DE-FG02-00ER45819, is gratefully acknowledged.