Evaluation of nanoparticles embedded in thin silicon dioxide film by optical reflection property

Surface and Coatings Technology

Volumn 196, Issue 1-3 SPEC. ISS., 2005, Pages 44-49

  Arai, Nobutoshi ^a,b   Tsuji, Hiroshi ^a   Ueno, Kazuya ^a   Matsumoto, Takuya ^a   Gotoh, Yasuhito ^a   Adachi, Kouichiro ^b   Kotaki, Hiroshi ^b   Ishikawa, Junzo ^a  

^a KYOTO UNIVERSITY   (Japan)

^b SHARP CORPORATION   (Japan)

Author keywords

Effective dielectrics; Multilayers; Nanoparticle; Nanoparticle composite; Optical reflection

Indexed keywords

GOLD; NANOSTRUCTURED MATERIALS; PARTICLE SIZE ANALYSIS; REFLECTION; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY;

ATOM IMPLANTATION; GATE OXIDES; OPTICAL REFLECTION; REFLECTANCE SPECTRA;

SILICA;

NANOPARTICLE;

EID: 18144418113     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.surfcoat.2004.08.090     Document Type: Article

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