A 0.35-μm CMOS 2-GHz VCO in wafer-level package

IEEE Microwave and Wireless Components Letters

Volumn 15, Issue 4, 2005, Pages 229-231

  Yoon, Sang Woong ^a   Pinel, Stephan ^a   Laskar, Joy ^a  

^a GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

Complementary metal oxide semiconductor (CMOS); Inductor; Quality factor (Q factor); Voltage controlled oscillator (VCO); Wafer level package (WLP)

Indexed keywords

ELECTRIC INDUCTORS; ELECTRIC RESISTANCE; INDUCTANCE; LOGIC DESIGN; MICROPROCESSOR CHIPS; Q FACTOR MEASUREMENT; SPURIOUS SIGNAL NOISE; VARIABLE FREQUENCY OSCILLATORS;

COMPLEMENTARY METAL OXIDE SEMICONDUCTOR (CMOS); QUALITY FACTOR (Q-FACTOR); SERIES RESISTANCE; WAFER LEVEL PACKAGE (WLP);

CMOS INTEGRATED CIRCUITS;

EID: 18144404354     PISSN: 15311309     EISSN: None     Source Type: Journal    
DOI: 10.1109/LMWC.2005.845699     Document Type: Article

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