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Volumn , Issue , 2004, Pages 847-856

Hierarchical DFT methodology - A case study

Author keywords

[No Author keywords available]

Indexed keywords

DESIGN FOR TESTABILITY METHODOLOGY; HIERARCHICAL APPROACH; PHYSICAL DESIGN; SYSTEM ON CHIP DESIGN;

EID: 18144392000     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (14)

References (13)
  • 3
    • 18144373719 scopus 로고    scopus 로고
    • Heading off test problems posed by SoC
    • October 16
    • Ron Press, Janusz Rajski, "Heading off test problems posed by SoC", EE Times, October 16, 2000.
    • (2000) EE Times
    • Press, R.1    Rajski, J.2
  • 5
    • 33847161035 scopus 로고    scopus 로고
    • Test methodology for motorola's high performance e500 core based on powerPC instruction set architecture
    • Bailey, Metayer, Svrcek, Tendolkar, Wolf, Fiene, Alexander, Woltenberg, Raina, "Test Methodology for Motorola's High Performance e500 Core Based on PowerPC Instruction Set Architecture", International Test Conference 2002.
    • International Test Conference 2002
    • Bailey, M.1    Svrcek, T.2    Wolf, F.3    Alexander, W.4    Raina5
  • 6
    • 18144399566 scopus 로고    scopus 로고
    • DFT takes on test cost in final combat
    • October
    • Wilson, Ron, "DFT Takes on Test Cost in Final Combat", Integrated System Design, October 2001
    • (2001) Integrated System Design
    • Wilson, R.1
  • 8
  • 11
    • 0142215922 scopus 로고    scopus 로고
    • A reconfigurable power-conscious core wrapper and its application to SOC test scheduling
    • Eric Larsson, Zebo Peng "A Reconfigurable Power-Conscious Core Wrapper and its Application to SOC Test Scheduling", International Test Conference 2003
    • International Test Conference 2003
    • Larsson, E.1    Peng, Z.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.