Logic BIST with scan chain segmentation

Proceedings - International Test Conference

Volumn , Issue , 2004, Pages 57-66

  Lai, Liyang ^a   Patel, Janak H ^a   Rinderknecht, Thomas ^b   Cheng, Wu Tung ^b  

^a University of Illinois at Urbana Champaign   (United States)

^b MENTOR GRAPHICS CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CELLULAR AUTOMATON (CA); CIRCUIT UNDER TEST (CUT); LINEAR FEEDBACK SHIFT REGISTERS (LFSR); PSEUDO RANDOM PATTERN GENERATOR; WEIGHTED RANDOM PATTERN TESTING (WRPT);

BENCHMARKING; BOOLEAN FUNCTIONS; COMPUTER HARDWARE; MAPPING; MARKOV PROCESSES; PATTERN RECOGNITION; SHIFT REGISTERS;

LOGIC CIRCUITS;

EID: 18144383046     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (29)

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