Low-frequency noise measurements on submicrometre n-channel and p-channel MOSFETs at various operating regions

International Journal of Electronics

Volumn 88, Issue 4, 2001, Pages 411-421

  Belahrach, H ^a   Degerli Y ^b   Lavernhe, F ^b   Karim, M ^c   Magnan, P ^b   Farre, J ^b  

^a FACULTÉ DES SCIENCES ET TECHNIQUES GUÉLIZ   (Morocco)

^b UNIVERSITÉ DE TOULOUSE   (France)

^c SIDI MOHAMED BEN ABDELLAH UNIVERSITY   (Morocco)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 18044400087     PISSN: 00207217     EISSN: None     Source Type: Journal    
DOI: 10.1080/00207210110035314     Document Type: Article

References (14)

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