Surface morphology and chemistry of Prunus laurocerasus L. leaves: A study using X-ray photoelectron spectroscopy, time-of-flight secondary-ion mass spectrometry, atomic-force microscopy and scanning-electron microscopy

Planta

Volumn 221, Issue 1, 2005, Pages 123-134

  Perkins, Mark C ^a   Roberts, Clive J ^a   Briggs, David ^a   Davies, Martyn C ^a   Friedmann, Adrian ^b   Hart, Clifford A ^b   Bell, Gordon A ^b  

^a UNIVERSITY OF NOTTINGHAM   (United Kingdom)

^b JEALOTT S HILL INTERNATIONAL RESEARCH CENTRE   (United Kingdom)

Author keywords

Atomic force microscopy; Epicuticular wax; Prunus; Time of flight secondary ion mass spectrometry; X Ray photoelectron spectroscopy

Indexed keywords

AGRICULTURE; ATOMIC FORCE MICROSCOPY; BIOCHEMISTRY; MASS SPECTROMETRY; MORPHOLOGY; SURFACES; X RAY PHOTOELECTRON SPECTROSCOPY;

OUTERMOST MONOLAYERS; PHASE IMAGES; PLANT CUTICULE; TIME-OF-FLIGHT SECONDARY-ION MASS-SPECTROMETRY;

PLANTS (BOTANY);

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMISTRY; MASS SPECTROMETRY; METHODOLOGY; PLANT LEAF; PRUNUS; SCANNING ELECTRON MICROSCOPY; ULTRASTRUCTURE;

MICROSCOPY, ATOMIC FORCE; MICROSCOPY, ELECTRON, SCANNING; PLANT LEAVES; PRUNUS; SPECTROMETRY, MASS, SECONDARY ION;

AGRICULTURE; ANATOMY; BIOCHEMISTRY; ESCA; MASS SPECTROMETERS; PLANTS; SURFACES; X RAY SPECTROSCOPY;

PRUNUS; PRUNUS LAUROCERASUS;

EID: 18044385611     PISSN: 00320935     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00425-004-1417-0     Document Type: Article

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