Direct observation and analysis of kink dynamics

Surface Science

Volumn 447, Issue 1, 2000, Pages 25-38

  Hoogeman, M S ^a   Kuipers, L ^a   Schloßer D C ^a   Frenken, J W M ^b  

^a FOM INSTITUTE AMOLF   (Netherlands)

^b LEIDEN UNIVERSITY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVATION ENERGY; CRYSTAL ATOMIC STRUCTURE; DIFFUSION IN SOLIDS; DYNAMICS; GOLD; SCANNING TUNNELING MICROSCOPY; SILVER; SINGLE CRYSTALS;

KINK DYNAMICS; LOW INDEX SINGLE CRYSTAL SURFACES;

SURFACE PHENOMENA;

EID: 0033874856     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(99)01175-9     Document Type: Article

References (17)

1. Güntherodt H.-J., Wiesendanger R. Scanning Tunnelling Microscopy, vols. I, II & III. Springer Series in Surface Sciences. vol. 20:1992;Springer, Berlin. and references cited therein.
2. Kuipers L., Hoogeman M.S., Frenken J.W.M., van Beijeren H. Phys. Rev. B. 52:1995;11 387.
3. Giesen-Seibert M., Jentjens R., Poensgen M., Ibach H. Phys. Rev. Lett. 71:1993;3521 Phys. Rev. Lett. 73:1994;911. erratum.
4. Giesen-Seibert M., Jentjens R., Poensgen M., Ibach H. Phys. Rev. Lett. 71:1993;3521 Phys. Rev. Lett. 73:1994;911. erratum.
5. Masson L., Barbier L., Cousty J., Salanon B. Surf. Sci. 317:1994;L1115.
6. Zandvliet H.J.W., Wormeester H., Wentink D.J., van Silfhout A., Elswijk H.B. Phys. Rev. Lett. 70:1993;2122.
7. Morgenstern K., Rosenfeld G., Poelsema B., Comsa G. Phys. Rev. Lett. 74:1995;2058.
8. Barbier L., Masson L., Cousty J., Salanon B. Surf. Sci. 345:1996;197.
9. Giesen M. Surf. Sci. 370:1997;55.
10. Bartelt N.C., Goldberg J.L., Einstein T.L., Williams E.D. Surf. Sci. 273:1992;252.
11. Pimpinelli A., Villain J., Wolf D.E., Métois J.J., Heyraud J.C., Elkinani I., Uimin G. Surf. Sci. 295:1993;143.
12. Ihle T., Misbah C., Pierre-Louis O. Phys. Rev. B. 58:1998;2289.
13. Giesen-Seibert M., Ibach H. Surf. Sci. 316:1994;205.
14. Feller W. third ed. An Introduction to Probability Theory and its Applications. vol. I:1968;354 Wiley, New York. eq. 5.8.
15. Schwoebel R.L., Shipsey E.J. J. Appl. Phys. 37:1966;3682.
16. Ehrlich G., Hudda F.G. J. Chem. Phys. 44:1966;1030.
17. Stoltze P. J. Phys. Condens. Matter. 6:1994;9495.