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Volumn 87, Issue 1-4, 2005, Pages 311-316

Measurement of residual stress in EFG ribbons using a phase-shifting IR photoelastic method

Author keywords

EFG; Photoelasticity; Residual stress; Silicon ribbons

Indexed keywords

BUCKLING; GRAIN BOUNDARIES; INFRARED RADIATION; LIGHT PROPAGATION; PHASE SHIFT; PHOTOELASTICITY; PHOTOVOLTAIC EFFECTS; RESIDUAL STRESSES; SEMICONDUCTOR GROWTH; SOLAR CELLS;

EID: 17644422186     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.solmat.2004.07.028     Document Type: Conference Paper
Times cited : (13)

References (17)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.