Heavy-Ion Single-Event Effects Testing of Lead-on-Chip Assembled High-Density Memories

IEEE Transactions on Nuclear Science

Volumn 50, Issue 6 I, 2003, Pages 2322-2327

  Harboe Sorensen R ^a   Guerre, F X ^b   Loquet, J G ^b   Tizon, C ^b  

^a EUROPEAN SPACE AGENCY   (Netherlands)

^b Hirex Engineering   (France)

Author keywords

Heavy ion irradiation; High density memories; Irradiation from the front or back side; Lead on chip; Plastic packaged; Preparation techniques; SDRAM; Single event effect testing; Single event upset; SRAM; Test approaches; Test facilities test analysis

Indexed keywords

ELECTRONICS PACKAGING; HEAVY IONS; ION BOMBARDMENT; RADIATION EFFECTS; SEMICONDUCTOR STORAGE; STATIC RANDOM ACCESS STORAGE;

HEAVY ION IRRADIATION; HIGH DENSITY MEMORIES; IRRADIATION FROM THE FRONT OR BACK SIDE; LEAD ON CHIP; PLASTIC PACKAGED; PREPARATION TECHNIQUES; SDRAM; SINGLE EVENT EFFECT TESTING; SINGLE EVENT UPSET; TEST APPROACHES;

SPACE RESEARCH;

EID: 1242265215     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2003.821402     Document Type: Conference Paper

References (9)

1. R. Harboe Sørensen, R. Müller, E. Daly, B. Nickson, J. Schmitt, and F. J. Rombeck, "Radiation pre-screening of 4-Mbit dynamic random access memories for space applications," in Proc. RADECS 1991 Conf., La Grande-Motte. France, 1991, pp. 489-504.
2. R. Harboe Sørensen, P. Vuilleumier, L. Adams. B. Nickson, and R. Müller, "Radiation testing of flight lots for MARS-94 covering - semiconductor types as 4-Mbit DRAM, 256-Kbit SRAM, 256-Kbit EEPROM and a 53C90 SCSI controller," in Proc. RADECS 1993 Conf., Saint-Malo, France, 1993, pp. 490-498.
3. R. Harboe Sørensen, R. Müller, and S. Fraenkel, "Heavy ion, proton and Co-60 radiation evaluation of 16-Mbit DRAM memories for space application," in Proc. IEEE NSREC 1995 Workshop Rec., Madison, WI, 1995, pp. 42-49.
4. R. Harboe Sørensen, M. Bruggemann, R. Müller, and F. J. Rombeck, "Radiation evaluation of 3.3 volt 16M-bit DRAM's for solid state mass memory applications," in Proc. IEEE NSREC 1998 Workshop Rec., Newport Beach, CA, 1998, pp. 74-79.
5. G. Berger, G. Ryckewaert, R. Harboe Sørensen, and L. Adams, "The heavy ion irradiation facility at CYCLONE - a dedicated SEE beam line," in Proc. NSREC 1996 Workshop Rec., Indian Wells, CA, 1996, pp. 78-83.
6. A. Virtanen, J. Hyvonen, K. Ranttila, and J. Tuppurainen, "Heavy ion and proton test site at JYFL- accelerator laboratory," Nucl. Instrum. Methods A, vol. 426, pp. 68-71, 1999.
7. M. A. MCMahan, "Radiation effects testing at the 88-inch cyclotron," in Proc. RADECS 1999 Conf., Fontevraud, France, 1999, pp. 142-147.
8. R. Koga, S. H. Crain, P. Yu, and K. B. Crawford, "SEE sensitivity determination of high-density DRAM's with limited-range heavy ions," in Proc. IEEE NSREC 2001 Workshop Rec., Vancouver, BC, Canada, 2001, pp. 182-189.
9. S. Duzellier, D. Falguere, T. Nuns, F. Bezerra, and J. Bertrand, "Observation of the SEE response of a 256-Mb SDRAM," in Proc. RADECS 2002 Workshop, Padova, Italy, to be published.