Test results of Total Ionizing Dose conducted at the Jet Propulsion Laboratory

IEEE Radiation Effects Data Workshop

Volumn , Issue , 2004, Pages 36-41

  Rivas, Rosa M ^a   Johnston, Allan H ^a   Miyahira, Tetsuo F ^a   Rax, Bernard G ^a   Wiedeman, Michael D ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

Bipolar; Complementary Metal Oxide Semiconductors (CMOS); Enhanced Low Dose Rate Sensitivity (ELDRS); High Dose Level (HDL); Low Dose Level (LDL); Total Ionizing Dose (TID)

Indexed keywords

ELECTRIC POTENTIAL; FAILURE ANALYSIS; GAMMA RAYS; IONIZING RADIATION; JUNCTION GATE FIELD EFFECT TRANSISTORS; MICROELECTRONICS; SEMICONDUCTOR MATERIALS; SENSITIVITY ANALYSIS; SPACE APPLICATIONS; THERMOMETERS;

BIPOLAR; COMPLEMENTARY METAL OXIDE SEMICONDUCTORS (CMOC); ENHANCED LOW RATE SENSITIVITY (ELDRS); HIGH DOSE LEVEL (HDL); LOW DOSE LEVEL (LDL); TOTAL IONIZING DOSE (TID);

ELECTRONIC EQUIPMENT TESTING;

EID: 17644395937     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)

1. A. H. Johnston et al, "Total dose effects in conventional bipolar transistors and linear integrated circuits," IEEE Trans. Nucl. Sci., vol. 41, no. 6, pp2427-2436, Dec.1994.
2. Analog Devices, Inc., "RADTEST Data Service," April 1999, pp. 4, 21.
3. A. H. Johnston, B. G. Rax and C. I. Lee, "Enhanced Damage in Linear Intefrated Circuits at Low Dose Rate," IEEE Trans. Nucl. Sci., 42 (6), pp. 1650-1656 (1995).
4. S.S. McClure, J. L. Gorelick, C. C. Yui, B. G. Rax, M. D. Wiedeman, "Continuing Evaluation of Bipolar Linear Devices for Total Dose Bias Dependency and ELDRS Effects," 2003 IEEE Radiation Effects Data Workshop Record, pp. 1-5, 2003.
5. B.E. Pritchard, B.G. Rax, S.S. McClure, "Recent Radiation Test Results at JPL," 2003 IEEE Radiation Effects Data Workshop Record, pp. 24-33, 2003.
6. C. Yui et al, "Total dose bias dependency and ELDRS effects in bipolar linear devices," 2002 IEEE Radiation Effects Data Workshop Record, pp. 131-137, 2002.