Total dose bias dependency and ELDRS effects in bipolar linear devices

IEEE Radiation Effects Data Workshop

Volumn 2002-January, Issue , 2002, Pages 131-137

  Yui, C C ^a   McClure, S S ^a   Rax, B G ^a   Lehman, J M ^a   Minto, T D ^a   Wiedeman, M D ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

Automatic testing; Circuit testing; Electronics packaging; Laboratories; Military aircraft; Propulsion; System testing; Temperature; Transducers; Voltage

Indexed keywords

AUTOMATIC TESTING; ELECTRIC POTENTIAL; ELECTRONICS PACKAGING; LABORATORIES; MILITARY AIRCRAFT; PROPULSION; TEMPERATURE; TRANSDUCERS;

CIRCUIT TESTING; DOSE RATE; ENHANCED LOW-DOSE-RATE SENSITIVITY; LINEAR DEVICES; LOW DOSE RATE; SYSTEM TESTING; TEST METHOD; TOTAL DOSE;

RADIATION EFFECTS;

EID: 17644368636     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/REDW.2002.1045543     Document Type: Conference Paper

References (8)

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2. S. S. McClure et al, "Dependence of total dose response of bipolar linear microcircuits on applied dose rate," IEEE Trans. Nucl. Sci., vol. 41, p. 2544, 1994.
3. A.H. Johnston et al, "Total dose effects in conventional bipolar transistors and linear integrated circuits," IEEE Nucl. Sci., vol. 41, p. 2427, 1994.
4. A.H. Johnston et al, "Enhanced damage in bipolar devices at low dose rates: effects at very low dose rate," IEEE Trans. on Nucl. Sci., NS-42, p. 3049, 1996.
5. Beaucour et al, "Total dose effects on negative voltage regulator," IEEE Trans. Nucl. Sci., vol. 45, p. 2649, 1994.
6. R.J. Graves et al, "Modeling low-dose-rate effects in irradiated bipolar-base oxides," IEEE Trans. Nucl. Sci., vol. 45, p. 2352, 1998.
7. R.L. Pease et al, "Elevated temperature irradiation of bipolar linear microcircuits," IEEE Trans. Nucl. Sci., vol. 43, p. 3161, 1996.
8. R.K. Freitag et al, "Study of low-dose-rate radiation effects on commercial linear bipolar Ics," IEEE Trans. Nucl. Sci., vol. 45, p. 2649, 1998.