Recent radiation test results at JPL

IEEE Radiation Effects Data Workshop

Volumn 2003-January, Issue , 2003, Pages 24-33

  Pritchard, B E ^a   Rax, B G ^a   McClure, S S ^b  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

^b NORTHROP GRUMMAN CORPORATION   (United States)

Author keywords

displacement damage; ELDRS; proton damage; Total ionizing dose

Indexed keywords

IONIZING RADIATION;

DISPLACEMENT DAMAGES; ELDRS; FAILURE LEVELS; PAPER DOCUMENTS; PROTON DAMAGE; RADIATION TESTS; RESPONSE MECHANISMS; TOTAL IONIZING DOSE;

RADIATION EFFECTS;

EID: 17644394671     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/REDW.2003.1281317     Document Type: Conference Paper

References (11)

1. S.S. McClure, C.C. Yui, B.G. Rax, and M.D. Wiedeman, "Continuing Evaluation of Bipolar Linear Devices for Total Dose Bias Dependency and ELDRS Effects," 2003 IEEE Radiation Effects Data Workshop Record, submitted for publication.
2. A.K. Sharma, K. Sahu, and S. Brashears, "Total Ionizing Dose (TID) Evaluation Results of Low Dose Rate Testing for NASA Programs," 1996 IEEE Radiation Effects Data Workshop Record, pp. 13-18.
3. R.L. Pease, et al., "An Updated Data Compendium of Enhanced Low Dose Rate Sensitive (ELDRS) Bipolar Linear Circuits," 2001 IEEE Radiation Effects Data Workshop Record, pp. 127-133.
4. JPL RadData website - http://radnet.jpl.nasa.gov/
5. Electronics Radiation Response Information Center (ERRIC) - http://erric.dasiac.com/
6. NASA-GSFC website - http://radhome.gsfc.nasa.gov/
7. European Space Agency (ESA), Spur Electron - http://www.comrad-uk.net/
8. European Space Components Information Exchange System (ESCIES) - https://escies.org/public/radiation/esa/database.html
9. ICS - http://www.icsrad.com/
10. SAVEinc - http://www.saveinc.com/index.html
11. A.H. Johnston, G.M. Swift, and B.G. Rax, "Total Dose Effects in Conventional Bipolar Transistors and Linear Integrated Circuits," IEEE Trans. Nuc. Sci., Dec. 1994, pp. 2427-36.