Charge contrast imaging of fine-scale microstructure and compositional variation in garnet using the environmental scanning electron microscope

American Mineralogist

Volumn 90, Issue 4, 2005, Pages 701-707

  Cuthbert, Simon J ^a   Buckman, James O ^b  

^a UNIVERSITY OF THE WEST OF SCOTLAND   (United Kingdom)

^b HERIOT WATT UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE TRAPPING; CRACKS; ELECTRONS; GRAIN BOUNDARIES; MICROSTRUCTURE; SCANNING ELECTRON MICROSCOPY; SECONDARY EMISSION;

CHARGE CONTRAST IMAGING; COMPOSITIONAL VARIATION; COUPLED SUBSTITUTION; ENVIRONMENTAL SCANNING ELECTRON MICROSCOPES; FINE-SCALE MICROSTRUCTURES; SECONDARY ELECTRON IMAGES; SECONDARY ELECTRONS; SURFACE CHARGE ACCUMULATIONS;

GARNETS;

ANALYTICAL METHOD; CRYSTAL STRUCTURE; GARNET; IMAGING METHOD;

EID: 17644382658     PISSN: 0003004X     EISSN: None     Source Type: Journal    
DOI: 10.2138/am.2005.1572     Document Type: Article

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