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Volumn 44, Issue 2, 2005, Pages 926-931

Measurement of electrical properties of GaN thin films using terahertz-time domain spectroscopy

Author keywords

Electrical properties; Spectroscopy; Thin film; THz

Indexed keywords

CARRIER CONCENTRATION; CARRIER MOBILITY; ELECTRIC CONDUCTIVITY; HIGH ELECTRON MOBILITY TRANSISTORS; SAPPHIRE; SEMICONDUCTOR DOPING; SPECTROSCOPIC ANALYSIS; THIN FILMS;

EID: 17444410020     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/JJAP.44.926     Document Type: Article
Times cited : (25)

References (16)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.