Dielectric constant measurement of thin films by differential time-domain spectroscopy

Applied Physics Letters

Volumn 76, Issue 22, 2000, Pages 3221-3223

  Jiang, Zhiping ^a   Li, Ming ^a   Zhang, X C ^a  

^a RENSSELAER POLYTECHNIC INSTITUTE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001627554     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.126587     Document Type: Article

References (9)

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