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Volumn 72, Issue 23, 1998, Pages 3032-3034
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Characterization of optically dense, doped semiconductors by reflection THz time domain spectroscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0000466719
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.121531 Document Type: Article |
Times cited : (156)
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References (9)
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