Blister formation and erosion due to blister fracture of SiC or Si

Journal of Nuclear Materials

Volumn 313-316, Issue SUPPL., 2003, Pages 408-412

  Yamauchi, Y ^a   Hirohata, Y ^a   Hino, T ^a  

^a HOKKAIDO UNIVERSITY   (Japan)

Author keywords

Blister fracture; Helium; Plasma wall interaction; Silicon; Silicon carbide

Indexed keywords

ANNEALING; EROSION; IRRADIATION; SILICON CARBIDE; SILICON WAFERS; SURFACE ROUGHNESS;

BLISTER FRACTURE;

PLASMA INTERACTIONS;

EID: 17144457070     PISSN: 00223115     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-3115(02)01400-9     Document Type: Conference Paper

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