A comparison of defects in helium implanted α- and β-SiC

Journal of Nuclear Materials

Volumn 283-287, Issue PART II, 2000, Pages 806-810

  Jung, P ^a   Klein, H ^a   Chen, J ^a  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001685820     PISSN: 00223115     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-3115(00)00211-7     Document Type: Article

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