Mueller matrix ellipsometry study of uniaxial deuterated potassium dihydrogen phosphate (DKDP)

Thin Solid Films

Volumn 455-456, Issue , 2004, Pages 624-627

  Synowicki, R A ^a   Hilfiker, James N ^a   Whitman, Pamela K ^b  

^a J A WOOLLAM CO INC   (United States)

^b LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

Author keywords

Deuterated potassium dihydrogen phosphate; Ellipsometry; Mueller matrix; Optical anisotropy; Optical axis; Potassium dihydrogen phosphate; Refractive index; VASE

Indexed keywords

ANISOTROPY; BIREFRINGENCE; DATA ACQUISITION; DATA REDUCTION; DEUTERIUM COMPOUNDS; ELLIPSOMETRY; HARMONIC GENERATION; LIGHT POLARIZATION; LIGHT TRANSMISSION; MATRIX ALGEBRA; REFRACTIVE INDEX;

DEUTERATED POTASSIUM DIHYDROGEN PHOSPHATE; MUELLER MATRIX; OPTICAL ANISOTROPY; OPTICAL AXIS; POTASSIUM DIHYDROGEN PHOSPHATE; VASE;

POTASSIUM COMPOUNDS;

EID: 17144449212     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2004.02.027     Document Type: Conference Paper

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